Non-contact width, height, diameter measurement

Cross-section measurement in production, process monitoring, control, documentation of production

ELOVIS sensors for non-contact width measurement and height or thickness measurement μMETER-X are working on the basis of the cross-section light scanner technology. The material edges are scanned optically and with a typical accuracy of 1/10 mm. The non-contact measurement of the width, height, thickness or diameter takes place during the ongoing production process, during the material transportation in longitudinal direction. The measurement is used for inline monitoring of the dimensions for compliance with the product tolerances and documentation of the delivery condition and, if applicable, the feedback to the process machine control. μMETER-X gauges are maintenance-free, permanently calibrated and measure largely independent of material. The systems are used to measure profiles, pipes, plates, beams, webs, tapes made of a wide variety of materials.

Width, height, diameter
of profiles

Do you measure the widths and heights of profiles in random samples, because optical micrometers can only cope with p...

non-contact-width measurement

Widths Measurement of webs, strips and boards

Widths of webs, tapes and plates are usually measured by hand in random sample inspections because contact measuremen...

Measure Free-Forms
and Profiles 2D / 3D

You want to measure geometries on flat free-forms in two dimensions or on free-form surfaces in three dimensions? ......

Application
Videos

ELOVIS Services

ELOVIS offers the following services for non-contact width and heigth measurement:

  • Consulting regarding width and height measurement 
  • Measurement & calibration services
  • System rental and sales of gauges
  • Assistance in dealing with measurement complaints of your customers

Always available for you:
Bernd Engelsdorf

ELOVIS GmbH

Vincenz-Prießnitz-Straße 1
76131 Karlsruhe, Germany

T +49 721 933823-0
F +49 721 933823-23

sales@elovis.de

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